Goa University

High-resolution x-ray scattering: from thin films to lateral nanostructures - 2nd ed.

Pietsch, Ullrich

High-resolution x-ray scattering: from thin films to lateral nanostructures - 2nd ed. - Germany: Springer; 2004 - xvi, 408 p. 23 cm.

Includes bibliographical references and index.

0387400923(hb)


Thin films optical properties
X-rays scattering
X-ray diffraction
Nanostructure materials

530.4175 PIE/Hig

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