High-resolution x-ray scattering: from thin films to lateral nanostructures - 2nd ed.
Pietsch, Ullrich
High-resolution x-ray scattering: from thin films to lateral nanostructures - 2nd ed. - Germany: Springer; 2004 - xvi, 408 p. 23 cm.
Includes bibliographical references and index.
0387400923(hb)
Thin films optical properties
X-rays scattering
X-ray diffraction
Nanostructure materials
530.4175 PIE/Hig
High-resolution x-ray scattering: from thin films to lateral nanostructures - 2nd ed. - Germany: Springer; 2004 - xvi, 408 p. 23 cm.
Includes bibliographical references and index.
0387400923(hb)
Thin films optical properties
X-rays scattering
X-ray diffraction
Nanostructure materials
530.4175 PIE/Hig