TY  - GEN
AU  - Pietsch, Ullrich
AU  - Holy, Vaclav
AU  - Baumbach, Tilo
TI  - High-resolution x-ray scattering: from thin films to lateral nanostructures - 2nd ed
SN  - 0387400923(hb)
U1  - 530.4175 PIE/Hig 
PY  - 2004///
CY  - Germany
PB  - Springer
KW  - Thin films optical properties
KW  - X-rays scattering
KW  - X-ray diffraction
KW  - Nanostructure  materials
N1  - Includes bibliographical references and index
ER  -